The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

May. 17, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Yeon Tae Kim, Suwon-si, KR;

Hun Yong Park, Suwon-si, KR;

Yihwan Kim, Suwon-si, KR;

Ji Hoon Kim, Suwon-si, KR;

Kee Soo Park, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 1/02 (2021.01); G01J 5/00 (2022.01); G01J 5/08 (2022.01); G01J 5/0801 (2022.01); G01J 5/53 (2022.01); G01K 11/12 (2021.01); H10P 72/00 (2026.01); G01J 5/02 (2022.01); G01J 5/80 (2022.01);
U.S. Cl.
CPC ...
G01K 1/026 (2013.01); G01J 5/0003 (2013.01); G01J 5/08 (2013.01); G01J 5/0801 (2022.01); G01J 5/53 (2022.01); G01K 11/12 (2013.01); H10P 72/0602 (2026.01); G01J 5/0007 (2013.01); G01J 2005/0074 (2013.01); G01J 5/026 (2013.01); G01J 5/0814 (2022.01); G01J 5/80 (2022.01);
Abstract

A substrate temperature measuring device includes a sensor which senses a first amount of light of a first light having a first wavelength, a second amount of light of a second light having a second wavelength, and a third amount of light of a third light having a third wavelength provided from a substrate, a first calculator to calculate a first temperature for the first wavelength, a second temperature for the second wavelength, and a third temperature of the wavelength through the first amount of light, the second amount of light and the third amount of light which are sensed, and a second calculator to calculate emissivity of the substrate and reflected energy of the substrate through the first temperature, the second temperature, and the third temperature, wherein a temperature of the substrate is calculated through the calculated emissivity of the substrate and the reflected energy of the substrate.


Find Patent Forward Citations

Quick Actions:

Kim, Yeon. (2026). Substrate temperature measuring device, substrate processing apparatus including the same, and substrate temperature measuring method using the same (U.S. Patent No. 12669382). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12669382

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