The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2026

Filed:

Mar. 01, 2024
Applicant:

Mitutoyo Corporation, Kawasaki, JP;

Inventors:

Shunsuke Tanaka, Kanagawa, JP;

Hirokazu Kobayashi, Saitama, JP;

Assignee:

MITUTOYO CORPORATION, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/00 (2006.01); G01B 5/24 (2006.01); G01B 7/30 (2006.01);
U.S. Cl.
CPC ...
G01B 3/004 (2013.01); G01B 5/24 (2013.01); G01B 7/30 (2013.01); G01B 2210/58 (2013.01);
Abstract

A measuring device includes a rotary encoder having a rotary scale and a plurality of detection portions, and a control device. The rotary scale are arranged around a rotation axis and has a scale pattern in which a plurality of patterns are arranged along a circumferential direction. The plurality of detection portions are arranged around the rotation axis, and reads the plurality of patterns from the scale pattern. The control device causes one or some detection portions to perform a first reading of the plurality of patterns at a first timing, causes another or other detection portions different from the one or some detection portions to perform a second reading of the plurality of patterns at a second timing different from the first timing, and calculates a measurement result based on a first reading result of the first reading and a second reading result of the second reading.


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