The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2026
Filed:
Dec. 28, 2021
Applicant:
The Curators of the University of Missouri, Columbia, MO (US);
Inventors:
Assignee:
The Curators of the University of Missouri, Columbia, MO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01P 7/06 (2006.01); G01R 27/26 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
H01P 7/06 (2013.01); G01R 27/2658 (2013.01); G01R 31/2805 (2013.01);
Abstract
A device for measuring a property of a substrate comprises an enclosure, two resonators, and two probes. The substrate has a top surface, and the enclosure defines a cavity for placing the substrate. The resonators extend into the cavity of the enclosure. The probes extend into the cavity, and each of the probes comprises a loop that extends about an axis that is substantially parallel to the top surface of the substrate so that the probes are operable to excite a transverse magnetic mode signal in the cavity.