The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Jun. 28, 2019
Applicant:

Roche Sequencing Solutions, Inc, Pleasanton, CA (US);

Inventors:

Fergal Casey, Pleasanton, CA (US);

Daniel M. Klass, Livermore, CA (US);

Alexander Lovejoy, Newark, CA (US);

Seyed Hamid Mirebrahim, Dublin, CA (US);

Amrita Pati, San Ramon, CA (US);

Hao Wang, Dublin, CA (US);

Assignee:

ROCHE SEQUENCING SOLUTIONS, INC, Pleasanton, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16B 20/20 (2019.01); C12Q 1/6869 (2018.01);
U.S. Cl.
CPC ...
G16B 20/20 (2019.02); C12Q 1/6869 (2013.01);
Abstract

Methods and systems for detecting MSI are provided. Also provided are methods for enriching human genomic DNA for microsatellite loci. Additionally, an oligonucleotide array for detecting MSI is provided. In some embodiments, the method for detecting MSI comprises detecting sequencing reads from a sample for a plurality of microsatellite loci; determining a metric for repeat length distribution (RLD) for each microsatellite locus; comparing the metric to a threshold value for the microsatellite locus; quantifying the number of microsatellite loci having an RLD metric exceeding the threshold value; and comparing the number of microsatellite loci having an RLD metric exceeding the threshold value to a microsatellite instability (MSI) proportion threshold.


Find Patent Forward Citations

Loading…