The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Jul. 30, 2024
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Srdjan Malisic, San Jose, CA (US);

Chi Yuan, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G11C 29/1201 (2013.01); G11C 29/56012 (2013.01); G11C 2029/5602 (2013.01);
Abstract

The testing system comprises a processor and a local memory on a motherboard and an extension memory device under test (DUT). The local memory corresponds to a first address range within system memory and the extension memory DUT associated with a second address range within the system memory. The processor is operable to direct write latency testing of the extension memory DUT, including recording write latency measurement values. The recording can be done in a frequency table and the frequency table can be visualized (e.g., rendered, etc.) on a display. The testing comprises non-temporal write instructions that bypass processor caches. The extension memory DUT is compatible with a compute express link (CXL) protocol.


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