The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2026

Filed:

Apr. 08, 2024
Applicant:

Onto Innovation Inc., Wilmington, MA (US);

Inventors:

Keith F. Best, Andover, MA (US);

Corey Robert Shay, Amherst, NH (US);

Jyr Hong Soo, Princeton, NJ (US);

Assignee:

Onto Innovation Inc., Wilmington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G03F 7/706845 (2023.05); G03F 7/70633 (2013.01); G03F 7/70683 (2013.01); G03F 7/706839 (2023.05);
Abstract

Various examples herein describe an apparatus and related method to calibrate two in-line lithographic tools used as part of in-line, panel-production equipment. The two lithographic tools are used to expose opposing sides of a panel or substrate, such as, for example, an Advanced Integrated Circuit Substrates (AICS) panel or another type of panel or substrate, such as a copper-clad laminate (CCL) panel). The panel may be, for example, a flat-panel display or another substrate type. Other systems, apparatuses, and methods are also disclosed.


Find Patent Forward Citations

Best, Keith. (2026). Front-to-back overlay (ftbo) standard (U.S. Patent No. 12663730). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12663730

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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