The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Nov. 29, 2023
Carl Zeiss Microscopy Gmbh, Jena, DE;
Josef Biberger, Wildenberg, DE;
Carl Zeiss Microscopy, GmbH, Jena, DE;
Abstract
A position of an object in a beam apparatus is determined where the beam apparatus has a processor unit which is used for processing, imaging and/or analyzing the object. Determining the position of the object includes providing firstly a predefinable region of the object and secondly a marking in the beam apparatus. The predefinable region has a first position in relation to the marking. The first position is given by a first distance and a second distance. Determining the position of the object also includes rotating the object or rotating a capture device of the beam apparatus, determining a further second distance, and determining a second position of the predefinable region of the object in relation to the marking using the first distance, the second distance and the further second distance.