Valley search in read error recovery for a memory device using low-density parity check syndrome weight and auto-read calibration

Abstract

A processing device in a memory sub-system identifies a plurality of read retry offset voltages having respective check-fail bit counts that are within a target check-fail bit count range for a programming level of a memory device, performs one or more auto-read calibration operations for each of the plurality of read retry offset voltages, and determines respective syndrome weights for sense words read from the memory device using each of the plurality of read retry offset voltages. The processing device further identifies a read retry offset voltage of the plurality of read retry offset voltages having a lowest respective syndrome weight, and performs an error recovery operation using the identified read retry offset voltage.