The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Jul. 16, 2024
Micron Technology, Inc., Boise, ID (US);
Casto Salobrena Garcia, Munich, DE;
Marcos Alvarez Gonzalez, Munich, DE;
Michael Dieter Richter, Ottobrunn, DE;
Thomas Hein, Munich, DE;
Ronny Schneider, Höhenkirchen-Siegertsbrunn, DE;
Micron Technology, Inc., Bosie, ID (US);
Abstract
Methods, systems, and devices for indicating data corruption are described. A memory system may be configured to identify and store corrupted data received from a host system without storing metadata. As part of transmitting a bulk transmission, the host system may transmit first data to be stored at an address of the memory system, and a first indication identifying that the first data is corrupted. The memory system may generate second data with a pattern of bits indicating that data stored at the address of the memory system is corrupted. The memory system may store the second data to the address, and later retrieve the second data in response to receiving a read command from the host system. Then, the memory system may generate a second indication identifying that the second data is corrupted, and transmit the second data and the second indication to the host system.