The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2026
Filed:
Sep. 28, 2022
Carl Zeiss Microscopy Gmbh, Jena, DE;
Manuel Amthor, Jena, DE;
Daniel Haase, Zoellnitz, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A computer-implemented method for the ordinal classification of at least one microscope image calculates a classification into one of a plurality of classes which form an order with respect to an image property. The microscope image is input into a machine-learned model for ordinal classification. The model comprises binary classifiers which calculate estimates regarding whether the microscope image belongs to cumulative auxiliary classes, which combine different numbers of the classes which follow each other in the order. The estimates can be combined so as to form a total score, wherein the classification occurs by comparing the total score with threshold values which can be defined in a variable manner depending on the application, or interval limits of the classes can be defined so that the classes form intervals of different widths. The model for ordinal classification can also comprise further binary classifiers for inverse auxiliary classes.