The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2026
Filed:
Nov. 03, 2022
Intel Corporation, Santa Clara, CA (US);
Gabor Liktor, San Francisco, CA (US);
Karthik Vaidyanathan, San Francisco, CA (US);
Tobias Zirr, Karlsruhe, DE;
INTEL CORPORATION, Santa Clara, CA (US);
Abstract
Sampling across multiple views in supersampling operation is described. An example of an apparatus includes one or more processing resources configured to perform a supersampling operation for image data generated for multiple views utilizing one or more neural networks, the processing resources including at least a first circuitry to process a first current frame including first image data for a first view, and a second circuitry to process a second current frame including second image data for a second view, the first view and second view being displaced from each other, the processing resources to receive for processing the first current frame and the second current frame, and perform supersampling processing utilizing the one or more neural networks based on at least the first current frame and the second current frame and one or more prior generated frames for each of the views.