The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Feb. 28, 2024
Applicant:

Stmicroelectronics International N.v., Geneva, CH;

Inventors:

Gianluca Tortora, Legnano, IT;

Mario Barone, Gorgonzola, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G06F 30/333 (2020.01); G11C 29/32 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318536 (2013.01); G01R 31/318541 (2013.01); G06F 30/333 (2020.01); G11C 29/32 (2013.01); G11C 2029/3202 (2013.01);
Abstract

An integrated circuit includes a sequential logic circuit and a circuit configured to change operation as a function of state output signals provided by state flip-flops of the sequential logic circuit. With a test mode signal asserted, a test circuit writes and reads the content of the state flip-flops in order to test the operation of the sequential logic circuit. A processing system includes at least one storage circuit interposed between the circuit and a respective state output signal. Each storage circuit receives the respective state output signal and provides a modified state signal to the circuit. When the test mode signal is de-asserted, the storage circuit provides the received state output signal in a transparent manner to the circuit and stores the received state output signal to a storage element. When the test mode signal is asserted, the storage circuit provides the stored state output signal to the circuit.


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