The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Nov. 26, 2021
Applicant:

Toshiba Mitsubishi-electric Industrial Systems Corporation, Tokyo, JP;

Inventors:

Takahiro Hiramatsu, Tokyo, JP;

Hiroyuki Orita, Tokyo, JP;

Assignee:

TMEIC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/74 (2006.01); G01F 1/7086 (2022.01);
U.S. Cl.
CPC ...
G01F 1/74 (2013.01); G01F 1/7086 (2013.01);
Abstract

In a mist flow rate measuring apparatus of the present disclosure, in a transparent pipe, a camera executes imaging processing of reflected light, the imaging processing having at least a part of a mist flowing region through which a mist-containing gas flows set as an imaging target region, and acquires imaging information. A mist flow rate calculation unit executes mist flow rate calculation processing based on the imaging information. The mist flow rate calculation processing includes sum value calculation processing of obtaining a luminance sum value, which is a sum of a plurality of luminance values indicated by the imaging information, and flow rate derivation processing of deriving the flow rate of the raw material mist from the luminance sum value.


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