The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Jul. 18, 2024
Chengdu University of Technology, Chengdu, CN;
Qiang Xu, Chengdu, CN;
Tong Jiao, Chengdu, CN;
Xing Zhu, Chengdu, CN;
Minggao Tang, Chengdu, CN;
Xu Chen, Chengdu, CN;
Chuhong Pu, Chengdu, CN;
Xianling Tao, Chengdu, CN;
Chengdu University of Technology, Chengdu, CN;
Abstract
A coaxial waveguide-based geotechnical multi-point deformation sensor and an adjustable gauge-length measurement method are provided. The coaxial waveguide-based geotechnical multi-point deformation sensor includes an outer conductor, open at opposite ends and hollow inside; magnetic metal support frames, inside the outer conductor, sequentially spaced along an axial direction of the outer conductor and each having a through-hole; an inner conductor inside the outer conductor and passing through each through-hole; and annular magnets, surrounding the outer conductor and configured to move along it, driving the nearest magnetic metal support frame to follow its movement. Each magnetic metal support frame acts as a reflection point. By reconstructing the interference spectra of any two reflection points, a gauge-length can exist between any two of the magnetic metal support frames. By collecting the changes in the interference spectrum signals of different gauge-lengths, deformation of geotechnical layers corresponding to the gauge-length(s) can be calculated, thus allowing the deformation of any geotechnical layer to be determined.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile