The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Feb. 15, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventor:

Jen-Yuan Chang, Hsinchu City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 25/065 (2023.01); H01L 21/56 (2006.01); H01L 23/00 (2006.01); H01L 23/31 (2006.01); H01L 23/48 (2006.01); H01L 25/00 (2006.01);
U.S. Cl.
CPC ...
H01L 25/0657 (2013.01); H01L 21/561 (2013.01); H01L 23/3121 (2013.01); H01L 23/481 (2013.01); H01L 24/16 (2013.01); H01L 24/29 (2013.01); H01L 24/32 (2013.01); H01L 24/96 (2013.01); H01L 25/50 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/29186 (2013.01); H01L 2224/32145 (2013.01); H01L 2224/32225 (2013.01); H01L 2224/73204 (2013.01); H01L 2224/96 (2013.01);
Abstract

A semiconductor structure and a method of manufacturing a semiconductor structure are provided. First semiconductor dies are formed from a first substrate, each of the first semiconductor die including an interconnect structure having a first dielectric material. A first thinning operation is performed on each of the first semiconductor dies. Second semiconductor dies are formed from a second substrate. The first semiconductor dies are bonded to a third substrate. A first gap between the first semiconductor dies is filled with a second dielectric material. The second semiconductor dies are bonded to the first semiconductor dies through a second bonding film, each of the first semiconductor dies electrically connected to each of the corresponding second semiconductor dies. A second gap between the second semiconductor dies is filled with a third dielectric material, at least one of the second and third dielectric materials different from the first dielectric material.


Find Patent Forward Citations

Chang, Jen-Yuan. (2026). Method of forming a semiconductor structure including bonding a plurality of first semiconductor dies to a plurality of second semiconductor dies (U.S. Patent No. 12642142). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12642142

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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