The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

May. 28, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Qun Su, Boise, ID (US);

Pitamber Shukla, Boise, ID (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01); G11C 29/46 (2006.01);
U.S. Cl.
CPC ...
G11C 29/46 (2013.01); G11C 29/12005 (2013.01); G11C 29/1201 (2013.01); G11C 2029/1202 (2013.01);
Abstract

Exemplary methods, apparatuses, and systems write data to a first wordline of a partially programmed block of memory. A second wordline of the block is determined to fail to satisfy a first margin threshold by comparing a first voltage threshold of the second wordline to a reference voltage. In response to the second wordline failing to satisfy the first margin threshold, a second margin test is applied to the block. In response to determining the block passed the second margin test, data is written in a subsequent write operation to the block using an adjusted trim setting.


Find Patent Forward Citations

Su, Qun. (2026). Reducing partial block programming using dynamic trim settings (U.S. Patent No. 12640223). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12640223

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…