The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2026

Filed:

Jul. 25, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Yu-Chung Lien, San Jose, CA (US);

Lakshmi Kalpana K Vakati, Fremont, CA (US);

Dheeraj Srinivasan, San Jose, CA (US);

Ting Luo, Santa Clara, CA (US);

Zhenming Zhou, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/57 (2013.01);
Abstract

In some implementations, a memory device may receive a single-level cell (SLC) program command. The memory device may determine, based on at least one of a randomized variable associated with the memory or a program-erase cycle count associated with the memory, a program verify scheme to be performed when executing the SLC program command. The program verify scheme may be one of a scheme associated with performing a program verify operation on all of the one or more subblocks of memory, a scheme associated with performing the program verify operation on a subblock associated with each odd word line (WL) to be programmed, or a scheme associated with performing the program verify operation on a subblock associated with each even WL to be programmed. The memory device may execute the SLC program command by implementing the program verify scheme.


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