The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
Oct. 25, 2021
Applicant:
Konica Minolta, Inc., Tokyo, JP;
Inventors:
Assignee:
KONICA MINOLTA, INC., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41865 (2013.01); G05B 2219/31372 (2013.01);
Abstract
A manufacturing condition optimization apparatus includes a yield estimator for estimating a yield of a product having a quality that passes inspection by inspection equipment when a manufacturing condition of the product that is manufactured by manufacturing equipment is changed and an optimization processor for calculating an amount of change in the manufacturing condition at which the yield is maximized.
Kadena, Kenichi. (2026). Manufacturing condition optimization apparatus, computer program product, and manufacturing condition optimization method (U.S. Patent No. 12638834). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12638834
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