The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
Oct. 24, 2023
Carl Zeiss Microscopy Gmbh, Jena, DE;
Joerg Steinert, Jena, DE;
Johannes Bautsch, Braunschweig, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method including the following: a) a light field microscope records at least one image of a sample, said image consisting of a set of partial images, b) at least one aberration of the imaging system of the light field microscope is specified by a user and/or established from a set of partial images recorded in step a), c) one or both of steps d) and e) are performed using the aberrations of the imaging system specified and/or established in step b): d) reconstructing a three-dimensional image of the sample from the set of partial images, wherein the aberrations of the imaging system which are specified and/or established in step b) are at least partially corrected; e) establishing improved settings of adjustable components of the imaging system which influence wavefronts of the propagated light, on the basis of the aberrations specified and/or established in step b). The invention also relates to a microscopy apparatus.