The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

May. 29, 2024
Applicant:

Fei Company, Hillsboro, OR (US);

Inventor:

Konstantin Balashov, Hillsboro, OR (US);

Assignee:

FEI COMPANY, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/80 (2024.01); G03H 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/80 (2024.01); G03H 5/00 (2013.01); G03H 2224/04 (2013.01);
Abstract

Embodiments herein relate to a process for electron holography image aberration reduction. A system can comprise a memory that stores, and a processor that executes, computer executable components. The computer executable components can comprise a propagating component that reduces hologram aberration of an electron hologram (EH) image by modifying of a pair of sequenced parameters of an array upon which the EH image is constructed, resulting in a modified array, and a generating component that generates a propagated EH image using a propagator comprising the modified array.


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Balashov, Konstantin. (2026). Correction of aberrations in in-line electron holography (U.S. Patent No. 12632943). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12632943

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