The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Feb. 12, 2021
Hardware reliability diagnostics and failure detection via parallel software computation and compare
Intel Corporation, Santa Clara, CA (US);
Krishna Surya, Portland, OR (US);
William L. Hines, Lincoln, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Methods, apparatus, and software for hardware reliability diagnostics and failure detection via parallel software computation and compare. Parallel testing is performed on hardware resources such as processor cores, accelerators, and Other Processing Units (XPUs) using test algorithms such as encryption/decryption. The results of the testing (the algorithm outputs) are compared to detect errant hardware. Comparison may be across cores (via execution of software-based algorithms), across accelerators/XPUs (via algorithms implement in hardware) or between cores and accelerators/XPUs. Techniques are disclosed to enable all cores to be tested while a platform is performing a workload, such as in a data center environment, wherein unused cores are used for testing, with workloads being migrated between cores between tests.