The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2026

Filed:

Jun. 29, 2024
Applicant:

Hexagon Innovation Hub Gmbh, Heerbrugg, CH;

Inventors:

Thomas Jensen, Rorschach, CH;

Johan Stigwall, St.Gallen, CH;

Frank Przygodda, Lindau, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); G01B 11/24 (2013.01);
Abstract

A coordinate measuring machine for measuring a number of measuring points on a surface, the coordinate measuring machine comprising a base, a probe head with an optical probe, a machine structure for linking the probe head to the base, at least one drive mechanism for providing movability of the probe head relative to the base, at least one encoding unit, an optical overview sensor unit arranged at the machine structure and a controlling and processing unit adapted at least for controlling the drive mechanism. The optical probe comprises an optical detection unit, in particular a sensor, a variable focal length lens capable of modifying its focal length and an actuating unit configured and arranged relative to the variable focal length lens so that the actuating unit provides setting and varying the focal length as a function of a controlling signal.


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