The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Jun. 08, 2022
Applicant:

Shanghai Huahong Grace Semiconductor Manufacturing Corporation, Shanghai, CN;

Inventor:

Lei Wang, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10B 41/35 (2023.01); H10P 50/00 (2026.01); H10P 76/40 (2026.01);
U.S. Cl.
CPC ...
H10B 41/35 (2023.02); H10P 50/71 (2026.01); H10P 76/4085 (2026.01); H10P 76/4088 (2026.01);
Abstract

A photolithographic exposure method for a memory. In a photolithographic process for making a memory, when exposure is performed by using a mask, regions with different exposure dimension requirements on the memory are divided into different exposure groups. Regions with the same exposure resolution requirement are divided into the same group. Different exposure modes of exposure that are capable of correspondingly satisfying resolution requirements of each group are performed to different groups during exposure. During exposure, different illumination modes are adopted to perform exposure. Firstly, a first exposure mode is adopted to perform exposure to a memory array cell exposure group, then a wafer is kept stationary on a supporting platform, and then a second exposure mode is adopted to perform exposure to the other structure exposure group; after the exposure of all groups is completed, one-step development is performed to complete pattern transfer.


Find Patent Forward Citations

Wang, Lei. (2026). Photolithographic exposure method for memory (U.S. Patent No. 12628340). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12628340

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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