The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Apr. 19, 2023
Fei Company, Hillsboro, OR (US);
Eric Bosch, Eindhoven, NL;
Ivan Lazic, Eindhoven, NL;
FEI COMPANY, Hillsboro, OR (US);
Abstract
A computer-implemented method of processing image data according to the present disclosure comprises: receiving the image data, wherein the image data is scanning transmission charged-particle microscope (STCPM) image data representing a STCPM scan obtained at a first focus depth; and processing a system of equations expressing the image data as a sum of contributions from a plurality of slices of the sample at a plurality of focus depths, wherein each equation of the system of equations relates at least a portion of the image data to: at least one of a plurality of contrast transfer functions of the STCPM, each contrast transfer function of the STCPM being determined at a different respective focus depth; and at least one set of unknown objects of the STCPM, each unknown object in a set being at a different respective focus depth. The step of processing comprises solving the system of equations to obtain at least one of the plurality of unknown objects of the STCPM.
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