The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Dec. 12, 2022
Synopsys, Inc., Mountain View, CA (US);
Peilin Jiang, Santa Clara, CA (US);
Mayukh Bhattacharya, Palo Alto, CA (US);
Synopsys, Inc., Sunnyvale, CA (US);
Abstract
Test patterns are generated to test for a specified defect in an analog circuit by applying a succession of different strategies. Each strategy efficiently determines nominal responses and defect responses of the analog circuit to trial test patterns. The nominal response is a response of the analog circuit without the specified defect, and the defect response is a response of the analog circuit with the specified defect. Test patterns are selected based on differences between the nominal and defect responses.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile