The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Sep. 28, 2023
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Richard Hollinger, Jena, DE;

Jörg Siebenmorgen, Jena, DE;

Helmut Lippert, Jena, DE;

Ralf Wolleschensky, Jena, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/0036 (2013.01); G02B 21/367 (2013.01);
Abstract

A light sheet microscope for illuminating a sample arranged in an object plane on a sample carrier, comprising: an illumination device having an objective for illuminating the sample via an illumination beam path with a first light sheet, which intersects the sample volume in a first light sheet plane, the first light sheet plane intersecting the object plane at a skew first illumination angle (α), and a detection device for imaging of light coming from the sample, having an objective, the focal plane lying in the sample volume parallel to or in the object plane, and an area detector having a detector plane. The area detector includes a first slit stop in the detection beam path upstream of the area detector so as to mask out such regions of the sample volume which are illuminated by the first light sheet but lie outside the focal plane of the detection objective.


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