The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2026

Filed:

Mar. 08, 2022
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventors:

Sho Fujino, Kyoto, JP;

Koji Tominaga, Kyoto, JP;

Assignee:

HORIBA, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/08 (2022.01); G01J 5/00 (2022.01);
U.S. Cl.
CPC ...
G01J 5/0846 (2013.01); G01J 5/0007 (2013.01);
Abstract

There is provided a radiation temperature measurement device that accurately measures a temperature of an object being measured, and that includes two infrared detection units that detect mutually different infrared wavelength bands, a spectral characteristics data storage unit that stores spectral characteristics data showing a transmittance and a reflectance of each of the objects being measured, and a temperature calculation unit that, based on infrared ray quantities detected by each of the two infrared detection units, and on the transmittance and reflectance of each of the objects being measured, calculates the temperature of each of the objects being measured.


Find Patent Forward Citations

Fujino, Sho. (2026). Radiation temperature measurement device and radiation temperature measurement method (U.S. Patent No. 12625005). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12625005

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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