The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Jun. 16, 2020
Applicant:

Rohm Co., Ltd., Kyoto, JP;

Inventor:

Shingo Ota, Kyoto, JP;

Assignee:

ROHM CO., LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/16 (2006.01); H01L 21/02 (2006.01); H01L 21/683 (2006.01); H10D 48/01 (2025.01); H10D 62/40 (2025.01); H10D 62/832 (2025.01);
U.S. Cl.
CPC ...
H10D 62/8325 (2025.01); H01L 21/02008 (2013.01); H01L 21/6836 (2013.01); H10D 48/01 (2025.01); H10D 62/405 (2025.01); H01L 2223/54426 (2013.01);
Abstract

A method for manufacturing an SiC semiconductor device includes a step of setting, on a main surface of an SiC wafer, a scheduled cutting line that demarcates a plurality of chip regions including a first chip region in which a functional device is formed and a second chip region in which a monitor pattern for performing process control of the first chip region is formed, a step of forming, on the main surface, a plurality of main surface electrodes respectively covering the chip regions such as to expose the scheduled cutting line and respectively forming a portion of the functional device and a portion of the monitor pattern, a step of irradiating laser light to the scheduled cutting line and forming a modified region, and a step of cleaving the SiC wafer with the modified region as a starting point.


Find Patent Forward Citations

Ota, Shingo. (2026). Sic semiconductor device, and manufacturing method therefor (U.S. Patent No. 12622028). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12622028

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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