The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Sep. 23, 2021
Intel Corporation, Santa Clara, CA (US);
Xuesong Shi, Beijing, CN;
Sangeeta Manepalli, Chandler, AZ (US);
Rita Chattopadhyay, Chandler, AZ (US);
Peng Wang, Beijing, CN;
Yimin Zhang, Beijing, CN;
INTEL CORPORATION, Santa Clara, CA (US);
Abstract
An apparatus to facilitate learning reliable keypoints in situ with introspective self-supervision is disclosed. The apparatus includes one or more processors to provide a view-overlapped keyframe pair from a pose graph that is generated by a visual simultaneous localization and mapping (VSLAM) process executed by the one or more processors; determine a keypoint match from the view-overlapped keyframe pair based on a keypoint detection and matching process, the keypoint match corresponding to a keypoint; calculate an inverse reliability score based on matched pixels corresponding to the keypoint match in the view-overlapped keyframe pair; identify a supervision signal associated with the keypoint match, the supervision signal comprising a keypoint reliability score of the keypoint based on a final pose output of the VSLAM process; and train a keypoint detection neural network using the keypoint match, the inverse reliability score, and the keypoint reliability score.