The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Jan. 25, 2024
Carl Zeiss Microscopy Gmbh, Jena, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
Generating an overview image of an object includes, during a first capture duration, scanning regions of the object along a trajectory with illumination radiation, where the trajectory is chosen individually on the basis of properties of the object. First images of the object which together with position data (x, y, z) of an absolute distance measurement system are stored as an individual overview image are captured during the scanning of the trajectory. During a second capture duration, at least regions of the object are scanned with illumination radiation, and second images are captured; regions of the object which have already been imaged during the first capture duration are not imaged again. The first images captured during the first capture duration and the second images captured during the second capture duration are merged to form a resultant overview image of the object.