The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Dec. 23, 2020
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Nilesh Ahuja, Cupertino, CA (US);

Mahesh Subedar, Laveen, AZ (US);

Ranganath Krishnan, Hillsboro, OR (US);

Ibrahima Ndiour, Portland, OR (US);

Omesh Tickoo, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 7/58 (2006.01); G06N 3/045 (2023.01); G06N 3/047 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 7/582 (2013.01); G06N 3/045 (2023.01); G06N 3/047 (2023.01);
Abstract

Methods, apparatus, systems and articles of manufacture are disclosed to facilitate continuous learning. An example apparatus includes a trainer to train a first Bayesian neural network (BNN) and a second BNN, the first BNN associated with a first weight distribution and the second BNN associated with a second weight distribution. The example apparatus includes a weight determiner to determine a first sampling weight associated with the first BNN and a second sampling weight associated with the second BNN. The example apparatus includes a network sampler to sample at least one of the first weight distribution or the second weight distribution based on a pseudo-random number, the first sampling weight, and the second sampling weight. The example apparatus includes an inference controller to generate an ensemble weight distribution based on the sample.


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