The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Apr. 04, 2023
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Tiemo Anhut, Jena, DE;

Daniel Schwedt, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/00 (2023.01); G02B 21/00 (2006.01); G02B 21/08 (2006.01); H04N 23/957 (2023.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/008 (2013.01); G02B 21/082 (2013.01); H04N 23/957 (2023.01); H04N 23/56 (2023.01);
Abstract

The invention relates to a light-field microscope and a light-field microscopy image capturing method, including the steps of providing an illumination radiation from at least one light source; modulating the illumination radiation by virtue of adjusting the intensity distribution thereof; generating a dynamic light sheet in a sample space, in which a sample to be imaged can be arranged; scanning a region of the sample to be imaged using the light sheet; collecting a detection radiation and detecting image signals using light-field technology. The illumination radiation is modulated by virtue of the light source being controlled and an intensity of the illumination radiation provided by the light source being altered, especially in a controlled fashion over time. Image recordings of the sample are triggered for different positions of the light sheet.


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