The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Apr. 26, 2024
Applicant:
Synopsys, Inc., Sunnyvale, CA (US);
Inventor:
Adam D. Cron, Hilton Head Island, SC (US);
Assignee:
SYNOPSYS, INC., Sunnyvale, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/02 (2006.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2884 (2013.01);
Abstract
Built-in self-test (BIST) may be run on a set of circuits in proximity to a circuit under test (CUT) in an integrated circuit (IC) chip to generate noise and voltage drop conditions in the CUT. BIST may be run on the CUT while BIST is running on the set of circuits. A result of running the BIST on the CUT may be determined. The result may be associated with the noise and voltage drop conditions.