The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2026
Filed:
Mar. 14, 2024
Anritsu Corporation, Kanagawa, JP;
Itaru Miyazaki, Kanagawa, JP;
Eiji Tsujimura, Kanagawa, JP;
ANRITSU CORPORATION, Kanagawa, JP;
Abstract
To provide an X-ray inspection apparatus capable of obtaining a clear transmission image with less noise without reducing a conveyance speed of an inspection object. There is provided an X-ray inspection apparatus in which an X-ray generator and an X-ray detector are disposed to face each other with a conveyance path interposed between the X-ray generator and the X-ray detector, conveyance path through which inspection objects that are sequentially conveyed pass. The X-ray generator is configured to rotate within a range of a predetermined angle, and the X-ray detector is configured to move back and forth in a conveyance direction of the inspection object and an opposite direction, in conjunction with the rotation of the X-ray generator. A capturing axis from the X-ray generator to the X-ray detector follows the inspection object moving forth in the conveyance direction during at least capturing an image of the inspection object.