The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2026

Filed:

Aug. 08, 2023
Applicant:

Yamaha Fine Technologies Co., Ltd., Hamamatsu, JP;

Inventors:

Toru Ishii, Hamamatsu, JP;

Minoru Yamamoto, Fukuroi, JP;

Daisuke Homma, Hamamatsu, JP;

Kosei Fujita, Hamamatsu, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/22 (2006.01);
U.S. Cl.
CPC ...
G01M 3/229 (2013.01);
Abstract

An object of the present invention is to provide a chamber in which workpieces of different sizes can be positioned. A chamber according to an aspect of the present invention is a chamber for a leak tester, the chamber housing in the interior thereof a workpiece having an opening, the chamber including: a first member having a recess that forms a housing space for the workpiece; a second member adapted to close an open end of the recess; and a positioning mechanism for positioning the workpiece within the housing space such that the opening is in a predetermined position, wherein the positioning mechanism holds the workpiece apart from the first member and the second member.


Find Patent Forward Citations

Ishii, Toru. (2026). Chamber, lid, and leak tester (U.S. Patent No. 12618741). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12618741

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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