Tester channel multiplexing in test equipment

Abstract

A test equipment includes a selection register configured to store a selection index determined based on a selection command, a first tester channel including a first waveform driving device, and a second tester channel including a second waveform driving device. Each of the first tester channel and the second tester channel is multiplexed by a plurality of Device Under Test (DUTs). The first waveform driving device and the second waveform driving device are coupled to the selection register. The first waveform driving device is configured to generate, based on a driving source signal, a first waveform signal for driving multiple of first pins of the plurality of DUTs, and control, based on the selection index and a first bit map corresponding to the first tester channel, an output of the first waveform signal through the first tester channel. The second waveform driving device is configured to generate, based on the driving source signal, a second waveform signal for driving multiple of second pins of the plurality of DUTs, and control, based on the selection index and a second bit map corresponding to the second tester channel, an output of the second waveform signal through the second tester channel.