The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Jul. 13, 2023
Hitachi, Ltd., Tokyo, JP;
Rahul Vishwakarma, Berkeley, CA (US);
Ravigopal Vennelakanti, San Jose, CA (US);
Nam Huyn, Milpitas, CA (US);
Masato Tamura, Santa Clara, CA (US);
Malarvizhi Sankaranarayanasamy, Mountain View, CA (US);
HITACHI, LTD., Tokyo, JP;
Abstract
Systems and methods for summarizing an infrastructure surface inspection video, which can involve processing frames of the infrastructure surface inspection video through a spatial in-frame process configured to conduct feature and text extraction on the frames on detected observations, the extracted features and text used to generate spatial metadata; processing the frames of the infrastructure surface inspection video through a temporal cross-frame process configured to detect changes across sequences of the frames including the spatial metadata, the temporal cross-frame process configured to generate temporal metadata encapsulating the detected changes; and processing the frames of the infrastructure surface inspection video through an activity decision process configured to intake the spatial metadata and temporal metadata to detect and track structural features or defects of interest as activity in the infrastructure surface inspection video and generate summary metadata from the spatial metadata, temporal metadata, and detected segments of interest.