The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2026
Filed:
Mar. 08, 2021
Carl Zeiss Microscopy Gmbh, Jena, DE;
Manuel Amthor, Jena, DE;
Daniel Haase, Zoellnitz, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
In a method for processing microscope images, at least a first image data set () of a microscope () is received. At least a first generative model () that describes the first image data set () is estimated with a first computing device () based on the first image data set (). Either a first generated image data set () is generated by the first generative model () and transmitted to a data exploitation device (), or the first generative model () is transmitted to a data exploitation device () and subsequently a first generated image data set () is generated by means of the first generative model (). Generated image data of the first generated image data set () is entirely data generated from the first generative model () and does not comprise processed image data of the first image data set () captured by the microscope (). The first generated image data set () is then exploited by means of the data exploitation device ().