The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Dec. 07, 2022
Applicant:

Asicland Co., Ltd., Suwon-si, KR;

Inventors:

Jong Min Lee, Suwon-si, KR;

Chang Eun Jang, Seoul, KR;

Assignee:

ASICLAND Co., Ltd., Suwon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/392 (2020.01); G06F 30/31 (2020.01); G06F 30/323 (2020.01); G06N 3/092 (2023.01);
U.S. Cl.
CPC ...
G06F 30/392 (2020.01); G06F 30/31 (2020.01); G06F 30/323 (2020.01); G06N 3/092 (2023.01);
Abstract

Disclosed are a system and a method for optimizing integrated circuit layout based on neural network. The system according to an exemplary embodiment of the present disclosure includes: a placement information generation unit generating placement information indicating placement positions of circuit blocks; a placement information filtering unit predicting a minimum substrate area required for placing the circuit blocks according to the generated placement information and when a predicted minimum substrate area does not correspond to a predetermined reference area range, discarding the generated placement information and requesting the placement information generation unit to generate subsequent placement information; and an EDA tool control unit providing the generated placement information to the EDA tool when the predicted minimum substrate area corresponds to the reference area range, and controlling the EDA tool to measure consumption power, performance, and an area of the target integrated circuit based on the generated placement position information.


Find Patent Forward Citations

Lee, Jong. (2026). System and method for optimizing integrated circuit layout based on neural network (U.S. Patent No. 12608529). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12608529

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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