The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Feb. 24, 2020
Applicant:

Ansys, Inc., Canonsburg, PA (US);

Inventors:

Zack Francis, Pittsburgh, PA (US);

Chong Teng, Shandong, CN;

Hai Dong, Zhejiang, CN;

Assignee:

Ansys, Inc., Canonsburg, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); B29C 64/386 (2017.01); B33Y 50/00 (2015.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); B29C 64/386 (2017.08); B33Y 50/00 (2014.12);
Abstract

Computer-implemented systems and methods are described herein for determining additive manufacturing parameters in a simulation. Input data regarding a product to be generated via additive manufacturing and a beam diameter are received. Based on the input data, a characteristic dimension is determined. The beam diameter is normalized based on the characteristic dimension. Additive manufacturing parameters, such as penetration depth and absorptivity, are determined based on the normalized beam diameter and experimentally-determined trends. The manufacturing of the product is then simulated according to the additive manufacturing parameters.


Find Patent Forward Citations

Loading…