The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Oct. 04, 2021
Applicant:

Xsys Prepress NV, Ypres, BE;

Inventors:

Pieter Lenssens, Zottegem, BE;

Dirk Ludo Julien De Rauw, Ninove, BE;

Daniel Fleischer, Rheinau, DE;

Assignee:

XSYS PREPRESS NV, Ypres, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G03F 7/2022 (2013.01); G03F 7/70525 (2013.01); G03F 7/7055 (2013.01); G03F 7/70625 (2013.01);
Abstract

A method to determine an exposure time and/or intensity to be used for obtaining a desired feature of a relief structure, in particular a desired floor thickness, includes exposing a first side of a relief precursor with electromagnetic radiation, where the exposure is done in an area having a first position A and a second position B and is performed such that for a plurality of points between said first and second positions A, B the values for the exposure time and the exposure intensity are known, wherein the exposure time and/or the exposure intensity are automatically controlled to be varied at said plurality of points; determining one or more points of said plurality of points representative for the desired feature; and determining the required exposure time and/or exposure intensity for the desired feature based on the determined one or more points and the known values.


Find Patent Forward Citations

Lenssens, Pieter. (2026). Method and system to determine an exposure time and/or intensity to be used for obtaining a desired feature of a relief structure (U.S. Patent No. 12607939). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12607939

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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