The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2026

Filed:

Jan. 26, 2022
Applicant:

Nissan Chemical Corporation, Tokyo, JP;

Inventors:

Tomotada Hirohara, Toyama, JP;

Mamoru Tamura, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/11 (2006.01); C08G 63/688 (2006.01); C09D 167/00 (2006.01); G03F 7/36 (2006.01); H10P 76/20 (2026.01);
U.S. Cl.
CPC ...
G03F 7/11 (2013.01); C08G 63/688 (2013.01); C08G 63/6888 (2013.01); C09D 167/00 (2013.01); H10P 76/2042 (2026.01); H10P 76/2045 (2026.01);
Abstract

A composition for forming a resist underlayer film that enables the formation of a desired resist pattern; and a method for producing a resist pattern and a method for producing a semiconductor device, each of which uses the composition for forming a resist underlayer film. (In formula (1), A, A, A, A, A, and Aeach independently represent a hydrogen atom, methyl group, or ethyl group; Qrepresents a divalent organic group; R1 represents a tetravalent organic group; and Rrepresents an alkenyl group or alkynyl group having 2-10 carbon atoms.) The film-forming composition contains a solvent and a polymer that has a unit structure given by formula (1).


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