The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Sep. 28, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Sangoh Park, Hwaseong-si, KR;

Hyunseo Shin, Hwaseong-si, KR;

Seokhan Park, Seongnam-si, KR;

Seunghune Yang, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/528 (2006.01); H01L 23/522 (2006.01); H10B 12/00 (2023.01); H10D 64/23 (2025.01);
U.S. Cl.
CPC ...
H01L 23/5283 (2013.01); H10B 12/0335 (2023.02); H10B 12/315 (2023.02); H10B 12/482 (2023.02); H10B 12/485 (2023.02); H10B 12/50 (2023.02); H10D 64/258 (2025.01);
Abstract

A semiconductor device may include a gate structure, first and second source/drain layers, first and second contact plugs, first and second conductive structures, and a third contact plug. The gate structure may be on a substrate. The first and second source/drain layers may be at upper portions, respectively, of the substrate on opposite sidewalls of the gate structure and adjacent thereto. The first and second contact plugs may be on the first and second source/drain layers, respectively, and each contact plugs may extend in a vertical direction. The first and second conductive structures may contact upper surfaces of the first and second contact plugs, respectively. The third contact plug may contact an upper surface of the second conductive structure. A height and a width of the second conductive structure may be greater than a height and a width of the first conductive structure.


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