The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Jul. 19, 2023
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Lior Huli, Albany, NY (US);

Nathan Antonovich, Albany, NY (US);

Dina Triyoso, Albany, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 14/60 (2026.01); C23C 16/04 (2006.01); C23C 16/40 (2006.01); C23C 16/455 (2006.01);
U.S. Cl.
CPC ...
H10P 14/6506 (2026.01); C23C 16/042 (2013.01); C23C 16/403 (2013.01); C23C 16/45525 (2013.01); H10P 14/6334 (2026.01);
Abstract

Various embodiments of methods are provided to control formation of self-assembled monolayers (SAMs) used in an area-selective deposition (ASD) process, and thus, prevent defects in the ASD process. In the disclosed embodiments, a SAM structure is formed via a spin-on process that includes: (a) a spin coating step for coating a surface of a semiconductor substrate with a liquid solution containing SAM-forming molecules, the semiconductor substrate having a target material and a non-target material exposed on the substrate surface, and (b) an anneal step for heat treating the semiconductor substrate to chemically bond the SAM-forming molecules to the non-target material exposed on the substrate surface. By controlling and/or varying process parameter(s) utilized during the anneal step, the embodiments disclosed herein improve the selectivity of the SAM structure to the non-target material and prevent defects from occurring when a film is subsequently deposited onto the target material.


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