The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
Dec. 01, 2021
Safran Aircraft Engines, Paris, FR;
Safran Electronics & Defense, Paris, FR;
Safran Landing Systems, Velizy-Villacoublay, FR;
Safran Nacelles, Gonfreville-L'orcher, FR;
Hakim Maalioune, Moissy Cramayel, FR;
Laurent Miralles, Moissy Cramayel, FR;
Christophe Bastide, Moissy Cramayel, FR;
Jérémy Edmond Fert, Moissy Cramayel, FR;
Vincent Hupin, Moissy Cramayel, FR;
SAFRAN AIRCRAFT ENGINES, Paris, FR;
SAFRAN ELECTRONICS & DEFENSE, Paris, FR;
SAFFAN LANDING SYSTEMS, Velizy-Villacoublay, FR;
SAFRAN NACELLES, Gonfreville-L'orcher, FR;
Abstract
Said method for determining aircraft landing runway conditions comprises the steps of: acquiring a set of data groups of different types (D, D) for evaluating and monitoring runway degradation conditions; deriving weighting coefficients (Ki) from each data group; filtering the data; determining, for each data group, a partial runway condition; modifying the weighting coefficients of each data group; and combining the partial runway conditions to derive a runway condition coefficient (RWYCC) associated with a confidence index (C) derived from the modified weighting coefficients.