The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
Mar. 18, 2022
Daikin Industries, Ltd., Osaka, JP;
Shogo Kawai, Osaka, JP;
Naomi Yoshimura, Osaka, JP;
Aoi Goto, Osaka, JP;
Wakana Takano, Osaka, JP;
Ryuichiro Oto, Osaka, JP;
Shotaro Maeda, Osaka, JP;
Mirei Kanetake, Osaka, JP;
Takashi Namikawa, Osaka, JP;
Shiho Watanabe, Osaka, JP;
DAIKIN INDUSTRIES, LTD., Osaka, JP;
Abstract
An sure, an inspection system and an inspection method that reduce the time required to inspect environmental microorganisms, are provided. The inspection system inspection system is for inspecting a microorganism or mold that is generated in an indoor environment or a device, and the inspection system includes an imaging unit configured to directly capture a sample collected from the indoor environment or the device; and an output unit configured to inspect the microorganism or the mold in image data captured by the imaging unit, and output an inspection result.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile