The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
Feb. 02, 2023
Advantest Corporation, Tokyo, JP;
Bernd Beterke, Aspach, DE;
Piotr Skwierawski, Frankenthal, DE;
Petra Funke, Aidlingen, DE;
Roland Friedrich, Winnenden, DE;
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
Methods and systems for determining whether a measurement system is used in a valid state, includes: automatically reading out a plurality of information items; automatically obtaining information on current operating environmental conditions; automatically reading reference information items identifying the measurement system components and/or representing one or more characteristics of the measurement system components and information on reference operating environmental conditions; and comparing the read out information items identifying the measurement system components and/or representing one or more characteristics of the measurement system components with the reference information items identifying the measurement system components and/or representing one or more characteristics of the measurement system components, and checking whether the current operating environmental conditions comprise an allowable value or are within an allowable range defined by the information on the reference operating environmental conditions, in order to determine whether the measurement system comprising the plurality of measurement system components is used in the valid state.