The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Jul. 01, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Wenlun Zhang, Chofu, JP;

Yuan He, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0625 (2013.01); G06F 3/0659 (2013.01); G06F 3/0673 (2013.01);
Abstract

Methods and systems for computing in-dynamic random access memory (DRAM) computing include loading a first group of cells of the DRAM with input parameters and loading a second group of cells of the DRAM with inverted input parameters that are each complementary to corresponding input parameters. An offset group of cells of the DRAM is loaded with an indication of an offset voltage. An operation is performed on weights with corresponding stored input parameters or the stored inverted input parameters, and a column of the first group and the second group is activated to perform an accumulation of the operations of weights for cells in the column to store a sum. An offset voltage is generated using the indication, and an output is generated based on the comparison of the sum and the offset voltage and is stored in an output group of cells of the DRAM.


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