The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Dec. 07, 2021
The Chinese University of Hong Kong, Shatin, HK;
Grail, Inc., Menlo Park, CA (US);
Yuk-Ming Dennis Lo, Hong Kong SAR, CN;
Kwan Chee Chan, Hong Kong SAR, CN;
Peiyong Jiang, Hong Kong SAR, CN;
Suk Hang Cheng, Hong Kong SAR, CN;
Ze Zhou, Hong Kong SAR, CN;
Tingting Xie, Hong Kong SAR, CN;
Guangya Wang, Hong Kong SAR, CN;
Chen Ding, Hong Kong SAR, CN;
The Chinese University of Hong Kong, Shatin, HK;
GRAIL, Inc., Menlo Park, CA (US);
Abstract
The ends of cell-free DNA fragments may be used for analysis of a biological sample. In some embodiments, DNA from a urine sample may be analyzed. Cell-free DNA fragments often include jagged ends, where one end of one strand of double-stranded DNA extends beyond the other end of the other strand. The length and amount of these jagged ends may be used to determine a level of a condition of an individual. The density of ends of fragments in certain regions may also be used in classifying the level of a condition. Additionally, DNA fragments may show a periodic pattern with the amount of DNA fragments corresponding to a length of the overhang. The periodicity may be analyzed to determine properties of a biological sample. Jagged ends may also be analyzed with a technique that avoids trimming overhanging 3' ends of a double-stranded DNA.