The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Aug. 12, 2022
Applicant:

Csmc Technologies Fab2 Co., Ltd., Jiangsu, CN;

Inventors:

Huajun Jin, Wuxi, CN;

Guipeng Sun, Wuxi, CN;

Feng Lin, Wuxi, CN;

Shuxian Chen, Wuxi, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 30/65 (2025.01); H01L 21/266 (2006.01); H10D 30/01 (2025.01); H10D 62/10 (2025.01); H10D 62/17 (2025.01);
U.S. Cl.
CPC ...
H10D 30/65 (2025.01); H01L 21/266 (2013.01); H10D 30/0281 (2025.01); H10D 62/107 (2025.01); H10D 62/393 (2025.01);
Abstract

A method for manufacturing a semiconductor device, and a semiconductor device. The method includes: providing a semiconductor substrate of a first conductivity type, forming a deep well of a second conductivity type in the semiconductor substrate, forming a channel region of the first conductivity type, a first well region of the first conductivity type, and a drift region of the second conductivity type in the deep well, the first well region and the channel region being spaced by a portion of the deep well, the drift region being located between the channel region and the first well region, forming an ion implantation region of the first conductivity type in the deep well, the ion implantation region being located under the drift region, and forming a source region of the second conductivity type and a drain region of the second conductivity type in the deep well.


Find Patent Forward Citations

Loading…